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SEM Zeiss Supra 40 |

Key Features
> Superb resolution and image
quality at low operating voltages.
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Wide operating
voltage range with minimal adjustments required.
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Short working
distance of 8.5 mm for simultaneous high resolution imaging and
X-ray analysis.
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High probe
current (up to 20 nA) and high stability better than 0.2 %/h for
analytical applications.
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High
efficiency In-lens detector for clear topographic imaging in high
vacuum mode
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Large 5-axes
motorised eucentric stage.
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Easy operation
through Windows® based SmartSEM™ control software.
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JEE-420 Vacuum Evaporator
The JEE-420 Vacuum Evaporator is a high-vacuum specimen
preparation station for both transmission and scanning electron
microscopy applications. It is particularly useful in the rapid
preparation of fine-grain TEM specimen support films by carbon
evaporation, or the evaporation of a variety of metals and other
materials in the preparation of replicas and shadow-cast
specimens.
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Langmuir-Blodgett Instrument
Priority Directions of Research:
· Study of monolayers at the air-water interface.
· Elaboration of LB film formation processes and successive
transfer of monolayers onto different types of substrates.
· Deposition of LB and LS layers for the following
applications:
superthin uniform dielectric films,
thin films of conducting organic materials,
thin films for nonlinear optics,
superthin photo- and electron beam coatings,
thin films of various biological molecules,
alternate-monolayer structures.
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Optical Microscopy with Digital Imaging
This equipment is used mainly for operative characterization of
the produced films for the purpose of technology elaboration. The
results of studies are used to find a correct way to change the
conditions of film deposition.
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FT-IR Spectrophotometer
FT-IR Spectrophotometer (transmission, ATR, grazing-angle modes).
Priority Directions of Research:
·
LB film characterization (monitoring of reactions, polymerization,
detection of protein adsorption).
· Study of structural characteristics.
· Study of the monolayers at the air-water interface.
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AFM/STM Thermomicroscopes
Microscope including AFM lithography
Priority Directions of Research
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Molecular resolution imaging of polymeric monolayers.
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Scanning Near-field Optical Microscopy (SNOM)
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Modified SNOM microscope with pump-probe configuration and
spettroscopy applications.
· set
up time and space resolved measurement of photoinduced
birefringence.
Priority Directions of Research
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Submicron spectroscopy and local birefringence in photosensitive
azopolymers.
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Raman Spectroscopy
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confocal CCD Raman microspectrometer (JY-Horiba T64000 triple
monochromator).
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high luminosity CCD Raman and luminescence spectrograph
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Argon-Krypton laser (6Watts).
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Ellipsometry
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Null-ellipsometer (lambda=633nm) with high
angular resolution (<0.002°), which enables to measure film
thickness with sub-Angstrom nominal precision in molecular
layers either on solid substrate or as Langmuir monolayers
floating on water surface. Imaging mode is also available. Sample
temperature can be controlled in the range –10 +80°C. Kinetics
experiments can be performed with time resolution of tens of
seconds. The same instrument can also measure Surface Plasmon
Resonance e.g. to measure refractive index in optically
anisotropic media.
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